| 摘要 |
PROBLEM TO BE SOLVED: To reject and relieve a defective bit caused by abnormality of bit line voltage by making bit line voltage variable and accelerating defect of a bit. SOLUTION: This circuit is provided with a VBL generating circuit 100, a test mode discriminating circuit 200, a large pump 300, a small pump 400. Thereby, defect of a bit having no margin can be detected for pre-charge voltage of a higher bit line or a lower bit line by making pre-charge voltage of bit lines variable.
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