| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory in which repair efficiency and versatility are improved, constitution is unity, and which has column redundant skeem of which data access speed is fast. SOLUTION: This device is provided with a plurality of input/output blocks which is divided into first and second blocks comprising a plurality of memory cells, column selecting lines for normal operation, spare column selecting lines for repair, and which comprises first local input output lines/first global input output lines taking charge of the first block and second local input output lines/second global input output lines taking charging of the second blocks. A defective column selecting line in the prescribed input output block is replaced by not only a spare column selecting line in the self-input-output block but a spare column selecting line in adjacent input output block. |
