发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To simply thin a semiconductor substrate in a mirror state. SOLUTION: When a thin film, that cannot be easily machined by the plasma CVM method, for example, Au film, is formed on the main or back surface of the semiconductor substrate 2, the thin film is mechanically polished by a grinding wheel 1, and is machined by the plasma CVM method, using an etching gas 4 in a radical state and an inert gas 5, after Si for composing the semiconductor substrate 2 is exposed. When the semiconductor substrate 2 is to be machined from a main-surface side, the machining by the plasma CVM method and the mechanical polishing using the grinding wheel 1 are combined, an interlayer insulating film and wiring that have different etching rates are machined uniformly.
申请公布号 JP2002246339(A) 申请公布日期 2002.08.30
申请号 JP20010350635 申请日期 2001.11.15
申请人 HITACHI LTD 发明人 MIZUKOSHI KATSURO;SHIMASE AKIRA;YORISAKI SHINGO;SUZUKI TAKESHI;OGUSHI SUSUMU;MIZUMURA MICHINOBU
分类号 H01L21/302;H01L21/304;H01L21/3065;H01L21/3205;(IPC1-7):H01L21/304;H01L21/306;H01L21/320 主分类号 H01L21/302
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