发明名称 Silicon thin film structure for optoelectronic devices and method for fabricating the same
摘要 Disclosed are a silicon thin film structure for optoelectronic devices and a method for manufacturing the same. The silicon thin film structure for optoelectronic devices, comprises a multi-layered structure consisting of a plurality of structural units, each comprising: a silicon base layer; and a luminescent, rare earth element-doped silica layer on said silicon base layer, or a multi-layered structure consisting of a plurality of structural units, each comprising: a silicon base layer; a lower undoped silica buffer layer for restraining the silicon layer from absorbing emitted light on said silicon base layer; a luminescent, rare earth element-doped silica layer for emitting light on said lower undoped silica buffer layer; and an upper, undoped silica buffer layer for restraining the silicon from absorbing emitted light on said luminescent, doped silica layer. Hence, while the multi-layered structures of silicon/silica are set as a basic backbone, the undoped silica layer is interposed between the silicon layer and the erbium-doped silica layer, thereby increasing the total luminescence efficiency. Additionally, the silica layer is so thin in the multi-layered structures that high electric conductivity can be attained.
申请公布号 US2002117673(A1) 申请公布日期 2002.08.29
申请号 US20010860382 申请日期 2001.05.18
申请人 MOON DAE-WON 发明人 MOON DAE-WON
分类号 H01L31/024;H01L33/00;H01L33/26;H01L33/34;(IPC1-7):H01L27/15 主分类号 H01L31/024
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