发明名称 Capacitor having a blended interface and a method of manufacture thereof
摘要 The present invention provides a method of manufacturing a capacitor on a semiconductor wafer. The method comprises placing a metal nitride film, such as a tantalum nitride film, on a substrate of a semiconductor wafer. A first electrode and a dielectric layer are created from the metal nitride film by subjecting the metal nitride film to a plasma oxidation process, which forms a blended interface between the first electrode and the dielectric layer. To complete the capacitor, a second electrode is formed over the dielectric. Interconnections with other semiconductor devices may also be formed on the wafer to create an operative integrated circuit.
申请公布号 US2002119622(A1) 申请公布日期 2002.08.29
申请号 US20010794380 申请日期 2001.02.27
申请人 STEIGERWALD MICHAEL L.;WONG YIU-HUEN;ZAHURAK SUSAN M. 发明人 STEIGERWALD MICHAEL L.;WONG YIU-HUEN;ZAHURAK SUSAN M.
分类号 H01L21/02;H01L21/316;H01L21/334;H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L21/02
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