发明名称 Method of manufacturing a semiconductor device
摘要 When a laser beam is irradiated onto a semiconductor film, a steep temperature gradient is produced between a substrate and the semiconductor film. For this reason, the semiconductor film contracts, so that a warp in the film occurs. Therefore, the quality of a resulting crystalline semiconductor film sometimes deteriorates. According to the present invention, it is characterized in that, after laser beam crystallization on the semiconductor film, heat treatment is carried out so as to reduce the warp in the film. Since the substrate contracts by the heat treatment, the warp in the semiconductor film is lessened, so that the physical properties of the semiconductor film can be improved.
申请公布号 US2002119633(A1) 申请公布日期 2002.08.29
申请号 US20020081767 申请日期 2002.02.25
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUMPEI;MITSUKI TORU;TAKANO TAMAE
分类号 H01L21/324;H01L21/336;(IPC1-7):H01L21/336 主分类号 H01L21/324
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