发明名称 |
APPARATUS AND METHOD FOR SURFACE POLISHING |
摘要 |
A brand new surface polishing apparatus replacing chemical mechanical polishing (CMP) employed in precise polishing of a semiconductor device requiring strain-free planarization machining. The surface polishing apparatus comprises means for supporting a work, a polishing tool of elastic material moving relatively to a plane of the work being polished, and means for supplying polishing slurry between the plane and the polishing tool. The plane is subjected to noncontact polishing utilizing a trace destruction phenomenon occurring when abrasive grains in the polishing slurry, taken into a micro gap formed between the plane and the polishing tool by means of the polishing tool during polishing operation, collide against the plane at a high speed and an accurate angle. |
申请公布号 |
WO02067307(A1) |
申请公布日期 |
2002.08.29 |
申请号 |
WO2001JP06355 |
申请日期 |
2001.07.23 |
申请人 |
KABUSHIKI KAISHA ISHIIHYOKI;NAKANO, TERUYUKI;KOZAWA, YASUHIRO;TAMBO, HITOSHI;NAKAHASHI, MANABU |
发明人 |
NAKANO, TERUYUKI;KOZAWA, YASUHIRO;TAMBO, HITOSHI;NAKAHASHI, MANABU |
分类号 |
B24B37/00;H01L21/304;(IPC1-7):H01L21/304;B24B37/04 |
主分类号 |
B24B37/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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