发明名称 APPARATUS AND METHOD FOR SURFACE POLISHING
摘要 A brand new surface polishing apparatus replacing chemical mechanical polishing (CMP) employed in precise polishing of a semiconductor device requiring strain-free planarization machining. The surface polishing apparatus comprises means for supporting a work, a polishing tool of elastic material moving relatively to a plane of the work being polished, and means for supplying polishing slurry between the plane and the polishing tool. The plane is subjected to noncontact polishing utilizing a trace destruction phenomenon occurring when abrasive grains in the polishing slurry, taken into a micro gap formed between the plane and the polishing tool by means of the polishing tool during polishing operation, collide against the plane at a high speed and an accurate angle.
申请公布号 WO02067307(A1) 申请公布日期 2002.08.29
申请号 WO2001JP06355 申请日期 2001.07.23
申请人 KABUSHIKI KAISHA ISHIIHYOKI;NAKANO, TERUYUKI;KOZAWA, YASUHIRO;TAMBO, HITOSHI;NAKAHASHI, MANABU 发明人 NAKANO, TERUYUKI;KOZAWA, YASUHIRO;TAMBO, HITOSHI;NAKAHASHI, MANABU
分类号 B24B37/00;H01L21/304;(IPC1-7):H01L21/304;B24B37/04 主分类号 B24B37/00
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