| 摘要 |
<p>An insert for electronic part test device, comprising a latch part moving between a position for covering and holding the upper surface of a tested electronic component stored in the insert and a position for moving away from the upper surface of the tested electronic component and a latch arm part rotatably supporting the latch part on an insert main body, wherein the tip of the latch part and the rotating center of the latch arm part are disposed generally on the same vertical line as viewed from the side of the insert, and the latch part and the rotating center of the latch arm part are offset as viewed from the horizontal plane of the insert.</p> |
