发明名称 Positive-working chemical-amplification photoresist composition
摘要 Disclosed is a positive-working chemical-amplification photoresist composition used in the patterning works in the manufacture of semiconductor devices, with which quite satisfactory patterning of a photoresist layer can be accomplished even on a substrate surface provided with an undercoating film of silicon nitride, phosphosilicate glass, borosilicate glass and the like in contrast to the prior art using a conventional photoresist composition with which satisfactory patterning can hardly be accomplished on such an undercoating film. The photoresist composition comprises, besides a film-forming resin capable of being imparted with increased solubility in an alkaline solution by interacting with an acid and a radiation-sensitive acid-generating compound, a phosphorus-containing oxo acid such as phosphoric acid and phosphonic acid or an ester thereof.
申请公布号 US2002119393(A1) 申请公布日期 2002.08.29
申请号 US20020126673 申请日期 2002.04.22
申请人 YUKAWA HIROTO;OOMORI KATSUMI;UCHIDA RYUSUKE;SAWAYANAGI YUKIHIRO 发明人 YUKAWA HIROTO;OOMORI KATSUMI;UCHIDA RYUSUKE;SAWAYANAGI YUKIHIRO
分类号 G03F7/039;G03F7/004;G03F7/09;H01L21/027;(IPC1-7):G03F7/038 主分类号 G03F7/039
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