发明名称 PLASMA PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a plasma processing apparatus which can improve the uniformity of the intra-plane film thickness of plasma treatment, for example, plasma CVD processing, and also improve the product yield. SOLUTION: The plasma processing apparatus is provided, in a treatment vessel 22 which can be evacuated, with a lower electrode 44 functioning also as a plate on which a body W to be treated is placed and an upper electrode 26, and applies high-frequency voltage between both electrodes to perform plasma treatment on the body to be treated. In the peripheral part of the lower electrode, a focusing ring 66 is provided with a prescribed interval on the outside from the outer periphery end surface of the body to be treated, wherein the prescribed interval is set within a range of 10 to 27 mm. This configuration realizes the improvement of the intra-plane uniformity of the film thickness of plasma treatment, for example, plasma CVD processing, and improvement of the product yield.
申请公布号 JP2002241946(A) 申请公布日期 2002.08.28
申请号 JP20010044255 申请日期 2001.02.20
申请人 TOKYO ELECTRON LTD 发明人 HATANO TATSUO;NARISHIMA KENSAKU
分类号 H05H1/46;B01J19/08;C23C16/509;H01L21/205;H01L21/302;H01L21/3065 主分类号 H05H1/46
代理机构 代理人
主权项
地址