发明名称 APPARATUS FOR PREVENTING DAMAGE OF CHUCK IN SEMICONDUCTOR FABRICATION EQUIPMENT
摘要 PURPOSE: An apparatus for preventing a damage of a chuck in semiconductor fabrication equipment is provided to prevent the damage of an ESC chuck by preheating Ar gas in a reflow process. CONSTITUTION: An MFC(Mass Flow Controller)(10) controls a pressure of Ar gas and provides the Ar gas to a preheat unit(12). The preheat unit(12) preheats the Ar gas supplied from the preheat unit(12) and provides the Ar gas to a chamber(20). A wafer(24) is loaded on an upper portion of an ESC chuck(22). The ESC chuck(22) is formed with a ceramic material. The ESC chuck(22) has an inner heater(26) and an outer heater(28). The ESC chuck(22) and the wafer(24) are formed in the chamber(20). The heat generated from the inner heater(26) and the outer heater(28) is transferred to the wafer(24) by the Ar gas.
申请公布号 KR20020068558(A) 申请公布日期 2002.08.28
申请号 KR20010008594 申请日期 2001.02.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, JIN YONG
分类号 H01L21/68;(IPC1-7):H01L21/68 主分类号 H01L21/68
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