DEVICE AND METHOD FOR INSPECTING SEMICONDUCTOR CIRCUIT FOR DRIVING MATRIX TYPE DISPLAY DEVICE

摘要

PROBLEM TO BE SOLVED: To efficiently inspect whether five values of output voltage are normally selected and output, in a semiconductor circuit for driving a display device performing four line selection. SOLUTION: An inspection pattern is input in the semiconductor circuit 14 per instruction from a controller 11, the output of the semiconductor circuit 14 for driving is compared with a previously calculated output pattern by an inspection result discriminating means 16 and a display element 17 or the like informs a person measuring as to whether the output is normal.