发明名称 RACK
摘要 PROBLEM TO BE SOLVED: To provide a rack capable of improving the reliability of evaluation tests on electronic components. SOLUTION: The rack 10 is provided with a pair of base materials 11 and 12 and spacers 13. The pair of base materials 11 and 12 comprises a plurality of substrate holding parts 20 for forming housing parts 30 for housing substrates VB to which the electronic components SC are joined. The pair of base materials 11 and 12 are each detachably connected to both end parts of the spaces 13, and the spacers 13 form intervals for housing the substrates VB between the base materials 11 and 12. At least the surfaces of the base materials 11 and 12 are made of a fluoropolymer.
申请公布号 JP2002243807(A) 申请公布日期 2002.08.28
申请号 JP20010047149 申请日期 2001.02.22
申请人 SONY CORP 发明人 SEKIDO ISAMU;HOSHINO MASAYUKI
分类号 G01R31/26;G01R31/30;H05K7/18;(IPC1-7):G01R31/30 主分类号 G01R31/26
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