| 摘要 |
PROBLEM TO BE SOLVED: To provide an abnormality detecting circuit and abnormality detecting device capable of surely detecting the abnormal condition regardless of manufacturing conditions and use conditions of the semiconductor integrated circuit. SOLUTION: A designated signal based on an operation clock is input to a delay circuit 2 having the same configuration as a component specified as a component constituting an obstacle to the operational guarantee of the semiconductor integrated circuit, and a signal obtained through the circuit is compared with a signal generated in a reference signal generating circuit 4 for regulating the reference time of the operational guarantee of the semiconductor integrated circuit. According to the comparison result of timewise delay of these signals, it is detected whether the use condition of the semiconductor integrated circuit is out of the normal operation condition or not. |
