| 摘要 |
PROBLEM TO BE SOLVED: To propose a multi-contact type probe easy to construct, used for high-frequency test of an integrated circuit or other microelectronic elements. SOLUTION: This probe is equipped with a substantially rigid support part and a multitude of contact fingers supported by and extending from the support part. The contact fingers are disposed as an integral assembly, thereby keeping the multitude of contact fingers in a prescribed arrangement when they are mounted on the support body. |
