发明名称 Method and apparatus for polishing
摘要 A polishing apparatus can improve the uniformity of thickness within a workpiece or reduce thickness variation between serially polished workpieces. The polishing apparatus comprises a polishing unit having a polishing tool for providing a polishing surface and a workpiece holding device for holding the workpiece. A polishing solution supplying device is provided for supplying a polishing solution into a polishing interface between the surface of the workpiece and the polishing surface. A temperature of the polishing interface is controlled according to at least an ambient temperature of a polishing space surrounding the polishing unit, as a variable parameter. <IMAGE>
申请公布号 EP0894570(A3) 申请公布日期 2002.08.28
申请号 EP19980114302 申请日期 1998.07.30
申请人 EBARA CORPORATION 发明人 KAWAMOTO, TAKAYOSHI;KIMURA, NORIO;YASUDA, HOZUMI;YOSHIDA, HIROSHI
分类号 B24B37/013;B24B37/015;B24B49/14;H01L21/304;(IPC1-7):B24B37/04 主分类号 B24B37/013
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