发明名称 METHOD FOR DETECTING HIGH IMPEDANCE FAULT THROUGH WAVELET TRANSFORM AND METHOD FOR MEASURING FAULT DISTANCE OF THE SAME
摘要 PURPOSE: A method for detecting high impedance fault through wavelet transform and a method for measuring fault distance of the same are provided to detect a fault of a transmission line and measure a fault distance accurately by performing a signal analysis through a wavelet transform about an over voltage and current generated in a high impedance fault. CONSTITUTION: A first process(S100) converts an analog signal of a three-phase voltage and current including an inputted fault phase into a digital signal. A second process(S200) performs a filtering through a secondary butterworth low pass filter to extract an N-th harmonic wave component from the converted digital signal. A third process(S300) performs a wavelet analysis about the filtered signal. A fourth process(S400) judges if a sum of each phase current is within a fault detection area, and generates a trip signal to detect a fault.
申请公布号 KR20020068215(A) 申请公布日期 2002.08.27
申请号 KR20010008511 申请日期 2001.02.20
申请人 SUNGKYUNKWAN UNIVERSITY 发明人 KIM, CHEOL HWAN;KIM, HYEON
分类号 G01R31/00;(IPC1-7):G01R31/00 主分类号 G01R31/00
代理机构 代理人
主权项
地址