发明名称 |
METHOD FOR DETECTING HIGH IMPEDANCE FAULT THROUGH WAVELET TRANSFORM AND METHOD FOR MEASURING FAULT DISTANCE OF THE SAME |
摘要 |
PURPOSE: A method for detecting high impedance fault through wavelet transform and a method for measuring fault distance of the same are provided to detect a fault of a transmission line and measure a fault distance accurately by performing a signal analysis through a wavelet transform about an over voltage and current generated in a high impedance fault. CONSTITUTION: A first process(S100) converts an analog signal of a three-phase voltage and current including an inputted fault phase into a digital signal. A second process(S200) performs a filtering through a secondary butterworth low pass filter to extract an N-th harmonic wave component from the converted digital signal. A third process(S300) performs a wavelet analysis about the filtered signal. A fourth process(S400) judges if a sum of each phase current is within a fault detection area, and generates a trip signal to detect a fault.
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申请公布号 |
KR20020068215(A) |
申请公布日期 |
2002.08.27 |
申请号 |
KR20010008511 |
申请日期 |
2001.02.20 |
申请人 |
SUNGKYUNKWAN UNIVERSITY |
发明人 |
KIM, CHEOL HWAN;KIM, HYEON |
分类号 |
G01R31/00;(IPC1-7):G01R31/00 |
主分类号 |
G01R31/00 |
代理机构 |
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地址 |
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