发明名称 Bump joining judging device and method, and semiconductor component production device and method
摘要 When electrodes on an electronic component and electrode portions on a circuit board are joined via bumps with the electronic component and the circuit board vibrated respectively, a vibration damping detect device and a deciding device detect damping of the vibration caused by a progress of joining between the bumps and the electrode portions, and then determine a good or defective of the joining on a basis of the damping of the vibration. Further, regarding an impedance of an ultrasonic oscillator, a movement amount of a nozzle, or a current supplying to a VCM, these waveforms during the joining are compared with waveforms of good joining thereof and then the good or defective is determined. According to the above constructions, the good or defective of the joining between the electronic component and the circuit board can be determined during the joining. Further, when a joining state becomes wrong during the joining, the joining state can be changed. Thus generation of defective components is prevented and a yield can be improved.
申请公布号 US6439447(B1) 申请公布日期 2002.08.27
申请号 US20010763959 申请日期 2001.02.28
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 MINAMITANI SHOZO;HIGASHI KAZUSHI;TAKAHASHI KENJI;KANAYAMA SHINJI;WADA HIROSHI;TSUJISAWA TAKAFUMI;AKITA MAKOTO;OKAMOTO KENJI;EGUCHI SHINZO;KAMETANI YASUHIRO
分类号 H01L21/66;(IPC1-7):B23K1/06;B23K5/20;B23K20/10;G01N29/04 主分类号 H01L21/66
代理机构 代理人
主权项
地址