发明名称 Post metal etch cleaning method
摘要 A post metal etch cleaning method which begins by providing a wafer with an etched metal layer formed thereon, wherein the etched metal layer is covered with a polymer residue. A fluorine based organic acid solvent is used to clean the metal layer, followed by removing the solvent by a physical method. Next, a de-ionized water is applied to flush the metal layer before performing a drying step on the wafer to dry the metal layer.
申请公布号 US6440873(B1) 申请公布日期 2002.08.27
申请号 US20010792952 申请日期 2001.02.26
申请人 UNITED MICROELECTRONICS CORP. 发明人 WU CHIH-NING;YANG CHAN-LON
分类号 C23G5/028;H01L21/02;H01L21/3213;(IPC1-7):H01L21/00 主分类号 C23G5/028
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