发明名称 |
Post metal etch cleaning method |
摘要 |
A post metal etch cleaning method which begins by providing a wafer with an etched metal layer formed thereon, wherein the etched metal layer is covered with a polymer residue. A fluorine based organic acid solvent is used to clean the metal layer, followed by removing the solvent by a physical method. Next, a de-ionized water is applied to flush the metal layer before performing a drying step on the wafer to dry the metal layer.
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申请公布号 |
US6440873(B1) |
申请公布日期 |
2002.08.27 |
申请号 |
US20010792952 |
申请日期 |
2001.02.26 |
申请人 |
UNITED MICROELECTRONICS CORP. |
发明人 |
WU CHIH-NING;YANG CHAN-LON |
分类号 |
C23G5/028;H01L21/02;H01L21/3213;(IPC1-7):H01L21/00 |
主分类号 |
C23G5/028 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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