发明名称 |
Method of copper-polysilicon gate formation |
摘要 |
In one embodiment, a method for manufacturing a field effect transistor (100) includes forming a polysilicon gate (104) on a surface (106) of a semiconductor substrate (102) in association with adjacent source/drain regions (110, 112) and forming dielectric spacers (124, 126) on sides of the polysilicon gate. The method further includes forming a trench (202) between the dielectric spacers on a surface (200) of the polysilicon gate and filling at least a portion of the trench with barrier and copper or other high conductivity metal to form a copper-polysilicon gate of the field effect transistor.
|
申请公布号 |
US6440830(B1) |
申请公布日期 |
2002.08.27 |
申请号 |
US20000651760 |
申请日期 |
2000.08.30 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
LOPATIN SERGEY |
分类号 |
H01L21/28;H01L21/285;H01L21/288;H01L21/336;H01L21/60;H01L29/49;(IPC1-7):H01L21/320;H01L21/476 |
主分类号 |
H01L21/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|