发明名称 Method of copper-polysilicon gate formation
摘要 In one embodiment, a method for manufacturing a field effect transistor (100) includes forming a polysilicon gate (104) on a surface (106) of a semiconductor substrate (102) in association with adjacent source/drain regions (110, 112) and forming dielectric spacers (124, 126) on sides of the polysilicon gate. The method further includes forming a trench (202) between the dielectric spacers on a surface (200) of the polysilicon gate and filling at least a portion of the trench with barrier and copper or other high conductivity metal to form a copper-polysilicon gate of the field effect transistor.
申请公布号 US6440830(B1) 申请公布日期 2002.08.27
申请号 US20000651760 申请日期 2000.08.30
申请人 ADVANCED MICRO DEVICES, INC. 发明人 LOPATIN SERGEY
分类号 H01L21/28;H01L21/285;H01L21/288;H01L21/336;H01L21/60;H01L29/49;(IPC1-7):H01L21/320;H01L21/476 主分类号 H01L21/28
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