TESTING DEVICE AND METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To provide a testing device and a test method of a semiconductor integrated circuit capable of facilitating control of a BOST device, and improving versatility. SOLUTION: This device has a constitution wherein an interface 28 for transferring a signal between the BOST device 20 and a CPU of an external control device 40 is installed, and a control signal for a test and a test analysis result signal are transferred through the interface 28, to thereby execute the test and the evaluation.