发明名称 |
METHOD OF FORMING ELECTRODE PASSED THROUGH SUBSTRATE, AND SUBSTRATE HAVING THROUGH ELECTRODE |
摘要 |
PROBLEM TO BE SOLVED: To form a through electrode passed through a silicon substrate and having a high aspect ratio. SOLUTION: A through hole 12 having a high aspect ratio is formed by a photo-excited electrolytic polishing process in a silicon substrate 11. The inner wall of the through hole 12 is subjected to oxidation to form an oxide film 21 as an insulating layer. Then a metal 23 is filled into the through hole 12 by a melted metal refilling process to form a through electrode (23). The through electrode 12 having a high aspect ratio can be easily formed in the substrate 11, and thus there can be easily achieved a semiconductor package having, e.g. stacked silicon IC chips. |
申请公布号 |
JP2002237468(A) |
申请公布日期 |
2002.08.23 |
申请号 |
JP20010034528 |
申请日期 |
2001.02.09 |
申请人 |
FUJIKURA LTD |
发明人 |
TAKIZAWA ISAO;SATOU AKINOBU;SUEMASU TATSUO;ITOI KAZUHISA |
分类号 |
H01L21/28;H01L21/02;H01L21/288;H01L21/3063;H01L21/316;H01L21/3205;H01L23/52;H01L25/065;H01L25/07;H01L25/18;(IPC1-7):H01L21/28;H01L21/306 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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