发明名称 METHOD OF FORMING ELECTRODE PASSED THROUGH SUBSTRATE, AND SUBSTRATE HAVING THROUGH ELECTRODE
摘要 PROBLEM TO BE SOLVED: To form a through electrode passed through a silicon substrate and having a high aspect ratio. SOLUTION: A through hole 12 having a high aspect ratio is formed by a photo-excited electrolytic polishing process in a silicon substrate 11. The inner wall of the through hole 12 is subjected to oxidation to form an oxide film 21 as an insulating layer. Then a metal 23 is filled into the through hole 12 by a melted metal refilling process to form a through electrode (23). The through electrode 12 having a high aspect ratio can be easily formed in the substrate 11, and thus there can be easily achieved a semiconductor package having, e.g. stacked silicon IC chips.
申请公布号 JP2002237468(A) 申请公布日期 2002.08.23
申请号 JP20010034528 申请日期 2001.02.09
申请人 FUJIKURA LTD 发明人 TAKIZAWA ISAO;SATOU AKINOBU;SUEMASU TATSUO;ITOI KAZUHISA
分类号 H01L21/28;H01L21/02;H01L21/288;H01L21/3063;H01L21/316;H01L21/3205;H01L23/52;H01L25/065;H01L25/07;H01L25/18;(IPC1-7):H01L21/28;H01L21/306 主分类号 H01L21/28
代理机构 代理人
主权项
地址
您可能感兴趣的专利