| 摘要 |
PROBLEM TO BE SOLVED: To provide a device hardly influenced by a noise or the like, capable of executing a high-speed test of a semiconductor device, concerning an external test auxiliary device suitable for improvement of measuring performance of a tester or for extension of its function. SOLUTION: A BOST board 44 is equipped with a connector 52, a BOST board substrate 50, and an external self-test circuit. The external self-test circuit includes an ADC/DAC measurement part 54 for transmitting a prescribed test signal to a specific terminal in the connector 52 based on a control signal inputted from the specific terminal in the connector 52, and receiving a response signal inputted into the specific terminal in the connector 52 corresponding to the test signal, and a DPS analysis part 58 for analyzing the response signal, determining whether the signal is a proper signal or not, and transmitting a test result signal for showing propriety of the response signal to the specific terminal provided in the connector 52.
|
