| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory which can discriminate easily whether each memory cell group is normal or not while shortening the test time. SOLUTION: A data input/output circuit of a SDRAM is provided with four discriminating circuits 15.0-15.3 for discriminating whether logic of respective four bits read-out data coincides with each other or not and outputting a signal of a level in accordance with a discriminated result, and two switching circuits 16.0, 16.1 giving output signals of respective two discriminating circuits 15.0 and 15.1, 15.2 and 15.3 to a tester successively by one clock cycle. Since two data input/output terminals T0, T8 may only be connected to the tester, a test time per one device is shortened, compared with conventional one in which four data input/output terminals are required to connect to the tester.
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