发明名称 PRESS DEVICE, IC HANDLER AND IC INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a press device capable of shortening an index time with a simple constitution, improving a processing capacity, and preventing an excessive pushing pressure applied to a part (IC device), and an IC handler and an IC handler inspection device. SOLUTION: This press device has an air cylinder 13 driven by an air pressure, for pressing the IC device, an electropneumatic regulator 35 for supplying the air cylinder 13 with air, and controlling the pressure applied to the air cylinder 13, and an electromagnetic three-way valve 37 installed between the electropneumatic regulator 35 and the air cylinder 13, for supplying the air cylinder 13 with the air from the electropneumatic regulator 35. The IC device is brought into contact with an inspection socket 41 in the state where the inside of the air cylinder 13 is decompressed, and when pressing the IC device, the electromagnetic three-way valve 37 is opened and the inside of the air cylinder 13 is pressurized up to a prescribed pressure for pressing the IC device with the optimum load.
申请公布号 JP2002236141(A) 申请公布日期 2002.08.23
申请号 JP20010032192 申请日期 2001.02.08
申请人 SEIKO EPSON CORP 发明人 NAKAMURA SATOSHI;SHIMOJIMA SOKO
分类号 G01R31/26;(IPC1-7):G01R31/26 主分类号 G01R31/26
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