发明名称 ELECTRONIC INSTRUMENT INSPECTION METHOD AND DEVICE
摘要 PROBLEM TO BE SOLVED: To apply a warming-up voltage to many electronic instruments, thereby put them into the inspection waiting state, and apply a reference inspection voltage only to one or more among them, thereby apply surely the reference inspection voltage to each electronic instrument. SOLUTION: This electronic instrument inspection method and this device are constituted so that the warming-up voltage 15a is applied to each electronic instrument 20, to thereby put it into the inspection waiting state, and that one or more electronic instruments 20 are selected and the applied voltage is switched to the reference inspection voltage 15b, to thereby supply surely each electronic instrument 20 with the reference inspection voltage 15b.
申请公布号 JP2002236138(A) 申请公布日期 2002.08.23
申请号 JP20010031137 申请日期 2001.02.07
申请人 TAMAGAWA SEIKI CO LTD 发明人 TAKABA YOSUKE
分类号 G01C25/00;G01C19/00;G01R31/00;(IPC1-7):G01R31/00 主分类号 G01C25/00
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