| 摘要 |
A thin film transistor is designed in such a manner that a semiconductor region includes source and drain electrodes in a channel width direction and further, a planar source-side overlap area constructed by a gate electrode, the source electrode and the semiconductor region and a planar drain-side overlap area constructed by the gate electrode, the drain electrode and the semiconductor region exist. An optimal overlap length of one of the source-side and drain-side overlap areas in a channel length direction is determined, for instance, to be 4 mum, for a light incident on a channel portion of the thin film transistor to have a light intensity below or equal to 0.2% of a light intensity of the backlight incident toward the thin film transistor, thereby reducing a light-induced OFF leak current sufficiently and further improving flickering and display uniformity.
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