发明名称 Rhodium-rich oxygen barriers
摘要 A structure and method are disclosed for forming a capacitor for an integrated circuit. The capacitor includes a rhodium-rich structure, a rhodium oxide layer in direct contact with the rhodium-rich structure, a capacitor dielectric in direct contact with the rhodium oxide layer and a top electrode over the capacitor. The rhodium-rich structure can include rhodium alloys and the capacitor dielectric preferably has a high dielectric constant.
申请公布号 US2002113260(A1) 申请公布日期 2002.08.22
申请号 US20010789335 申请日期 2001.02.20
申请人 YANG HAINING;GEALY DAN;SANDHU GURTEJ S.;RHODES HOWARD;VISOKAY MARK 发明人 YANG HAINING;GEALY DAN;SANDHU GURTEJ S.;RHODES HOWARD;VISOKAY MARK
分类号 C23C16/18;H01L21/02;H01L21/28;H01L21/285;H01L21/8242;H01L27/108;(IPC1-7):H01L21/824;H01L29/76;H01L29/94;H01L31/119 主分类号 C23C16/18
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