发明名称 High-speed rotation testing apparatus
摘要 A high-speed rotation testing apparatus includes a spindle 11 holding a test object S at its lower end, a driving motor 20 for applying torque to the spindle 11, and a frame 30 for supporting a rotor shaft 21 of the driving motor 20 so that the shaft is arranged toward the vertical direction of the apparatus, wherein the spindle 11 is driven directly by a driving motor 20 by inserting the spindle 11 into a through-hole 21a that penetrates the center of the rotor shaft 21 and coupling the upper ends of the rotor shaft 21 and the spindle 11 together, and the through-hole 21a has an inner diameter set so as to form a clearance in which the lower end of the spindle can swing, and further, a damping mechanism 40 that restrains swing is arranged in the vicinity of the lower end of the spindle 11, which projects from the lower end of the rotor shaft 21.
申请公布号 US2002112546(A1) 申请公布日期 2002.08.22
申请号 US20020067396 申请日期 2002.02.07
申请人 MARUWA ELECTRONIC INC. 发明人 SHIBASAKI KOJI;WATABE TAKESHI;SHIBASAKI SHIRO
分类号 G01M99/00;G01N3/00;G01N3/16;(IPC1-7):G01L1/00 主分类号 G01M99/00
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