发明名称 |
METAL-FERRO-METAL OXIDE SEMICONDUCTOR/METAL-FERRO-METAL SEMICONDUCTOR NON-VOLATILE MEMORY TRANSISTORS AND FABRICATING METHOD THEREOF |
摘要 |
PURPOSE: A method for fabricating a metal-ferro-metal oxide semiconductor(MFMOS)/metal-ferro-metal semiconductor(MFMS) non-volatile memory transistors is provided to prevent a ferroelectric material from being damaged in a plasma etching process by obviating the necessity of a gate stack etching process and minimizing etch-inducing damage. CONSTITUTION: A bottom electrode(16) is formed. A ferroelectric layer(24) is deposited over an active region beyond the margins of the bottom electrode. A top electrode(26) is deposited on the ferroelectric layer. A structure obtained by the above-described steps is metalized to form a source electrode(32), a gate electrode(34) and a drain electrode(36). |
申请公布号 |
KR20020066997(A) |
申请公布日期 |
2002.08.21 |
申请号 |
KR20020007479 |
申请日期 |
2002.02.08 |
申请人 |
SHARP CORPORATION |
发明人 |
HSU SHENG TENG;LI TINGKAI;ZHANG FENGYAN |
分类号 |
H01L21/8247;H01L21/28;H01L21/336;H01L21/8246;H01L27/105;H01L29/78;H01L29/788;H01L29/792;(IPC1-7):H01L27/105 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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