发明名称 |
Process of manufacturing a semiconductor device |
摘要 |
<p>A process of manufacturing a semiconductor device includes the steps of forming a stacked structure of a first III-V compound semiconductor layer (14) containing In and having a composition different from InP and a second III-V compound semiconductor layer (14A) containing In. The second III-V compound semiconductor layer (14A) is formed over the first III-V compound semiconductor layer (14) and growing an InP layer (16A, 16B) at regions adjacent the stacked structure to form a stepped structure (16a, 16b) of InP. The process further includes the step of wet-etching the stepped structure (16a, 16b) and the second III-V compound semiconductor layer (14A) using an etchant containing hydrochloric acid and acetic acid to remove at least the second III-V compound semiconductor layer (14A).</p> |
申请公布号 |
EP1233445(A2) |
申请公布日期 |
2002.08.21 |
申请号 |
EP20020250961 |
申请日期 |
2002.02.12 |
申请人 |
EUDYNA DEVICES INC. |
发明人 |
TAKAYUKI, WATANABE;TSUTOMU, MICHITSUTA;TARO, HASEGAWA;TAKUYA, FUJII |
分类号 |
H01L21/306;H01S5/042;H01S5/20;H01S5/227;H01S5/323;(IPC1-7):H01L21/306;H01S5/10 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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