发明名称 Process of manufacturing a semiconductor device
摘要 <p>A process of manufacturing a semiconductor device includes the steps of forming a stacked structure of a first III-V compound semiconductor layer (14) containing In and having a composition different from InP and a second III-V compound semiconductor layer (14A) containing In. The second III-V compound semiconductor layer (14A) is formed over the first III-V compound semiconductor layer (14) and growing an InP layer (16A, 16B) at regions adjacent the stacked structure to form a stepped structure (16a, 16b) of InP. The process further includes the step of wet-etching the stepped structure (16a, 16b) and the second III-V compound semiconductor layer (14A) using an etchant containing hydrochloric acid and acetic acid to remove at least the second III-V compound semiconductor layer (14A).</p>
申请公布号 EP1233445(A2) 申请公布日期 2002.08.21
申请号 EP20020250961 申请日期 2002.02.12
申请人 EUDYNA DEVICES INC. 发明人 TAKAYUKI, WATANABE;TSUTOMU, MICHITSUTA;TARO, HASEGAWA;TAKUYA, FUJII
分类号 H01L21/306;H01S5/042;H01S5/20;H01S5/227;H01S5/323;(IPC1-7):H01L21/306;H01S5/10 主分类号 H01L21/306
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