发明名称 |
Circuit board testing apparatus and method |
摘要 |
<p>A circuit board testing apparatus for testing continuity and/or short-circuit of wirings formed on a circuit board, includes an electromagnetic wave irradiator which irradiates first terminals of the wirings with an electromagnetic wave so that electrons are discharged from the first terminals by photoelectric effect. Discharged electrons are trapped by an electrode which is electrically biased to have a higher potential than that of the second terminals of the wirings, thereby causing an electric current to flow through the wirings via the electrode. Existence of open-circuit and/or short-circuit of the wirings is judged based on the current flowing the wirings.</p> |
申请公布号 |
EP1233275(A2) |
申请公布日期 |
2002.08.21 |
申请号 |
EP20020003210 |
申请日期 |
2002.02.19 |
申请人 |
NIHON DENSAN READ KABUSHIKI KAISHA |
发明人 |
TSUJI, YOSHIO;YAMADA, MASAYOSHI |
分类号 |
G01R31/02;G01R31/28;G01R31/309;(IPC1-7):G01R31/28;G01R31/308 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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