发明名称 |
Polymers, resist compositions and patterning process |
摘要 |
Polymers comprising recurring units of formula (1) and recurring units having acid labile groups are novel.At least one of R1 and R2 is fluorine or a trifluoromethyl group, and the remainder is hydrogen or a C1-20 alkyl, R3 and R4 each are hydrogen or an unsubstituted or fluorine-substituted C1-20 alkyl, or R3 and R4 may form a ring. Using such polymers, resist compositions featuring transparency to excimer laser light and alkali solubility are obtained.
|
申请公布号 |
US6436606(B1) |
申请公布日期 |
2002.08.20 |
申请号 |
US20000650408 |
申请日期 |
2000.08.29 |
申请人 |
SHIN-ETSU CHEMICAL CO., LTD. |
发明人 |
HATAKEYAMA JUN;WATANABE JUN;HARADA YUJI |
分类号 |
C08F234/02;G03F7/004;G03F7/039;(IPC1-7):C08F222/02;C08F16/24 |
主分类号 |
C08F234/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|