发明名称 Polymers, resist compositions and patterning process
摘要 Polymers comprising recurring units of formula (1) and recurring units having acid labile groups are novel.At least one of R1 and R2 is fluorine or a trifluoromethyl group, and the remainder is hydrogen or a C1-20 alkyl, R3 and R4 each are hydrogen or an unsubstituted or fluorine-substituted C1-20 alkyl, or R3 and R4 may form a ring. Using such polymers, resist compositions featuring transparency to excimer laser light and alkali solubility are obtained.
申请公布号 US6436606(B1) 申请公布日期 2002.08.20
申请号 US20000650408 申请日期 2000.08.29
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 HATAKEYAMA JUN;WATANABE JUN;HARADA YUJI
分类号 C08F234/02;G03F7/004;G03F7/039;(IPC1-7):C08F222/02;C08F16/24 主分类号 C08F234/02
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