| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a material for a low defective pin capable of contributing to improvement of a manufacturing yield of a printing pin for an impact printer head and to provide a method adequately detecting a defect. SOLUTION: In this method, X-rays are emitted to the printing pin in many directions by using a micro-focus X-ray testing device to improve a defect extracting rate.</p> |
