APPARATUS AND METHOD FOR CONTROLLING ZERO MARGIN ENABLE OF SENSE AMPLIFIER FOR USE IN SEMICONDUCTOR MEMORY DEVICE

摘要

PURPOSE: An apparatus and a method for controlling a zero margin enable of a sense amplifier for use in a semiconductor memory device is provided to perform a fuse cutting after confirming an optimum sense amplifier enable time for each chip in the semiconductor memory device beforehand. CONSTITUTION: A method for controlling a zero margin enable of a sense amplifier for use in a semiconductor memory device provided with a test part for determining a zero margin enable time of the sense amplifier through a test utilizing a variable length code and a fuse array includes steps of: performing(130) a test with varying the enable time until the enable of the sense amplifier becomes the zero margin and cutting(170) a corresponding fuse to become a code value which is used when the enable of the sense amplifier becomes the zero margin at the test step.