发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which can suppress generation of a short channel effects and the junction leakage current and which has a diffusion layer of a low resistance and a short transmission delay time. SOLUTION: On a side wall of the gate electrode 3 projecting on a substrate 1, a structure having a plurality of laminated films, that is, a plurality of side wall layer structures 4 and 5 are disposed. A gap 10a generated by the separation of the side wall layer 5 from the substrate 1 is filled with at least part of an elevated source and drain region 8.
申请公布号 JP2002231942(A) 申请公布日期 2002.08.16
申请号 JP20010362704 申请日期 2001.11.28
申请人 TOSHIBA CORP 发明人 KAMATA YOSHIKI;NISHIYAMA AKIRA
分类号 H01L29/78;H01L21/20;H01L21/8238;H01L27/092;(IPC1-7):H01L29/78;H01L21/823 主分类号 H01L29/78
代理机构 代理人
主权项
地址
您可能感兴趣的专利