发明名称 METHOD OF FORMING SEMICONDUCTOR THIN FILM AND OF MANUFACTURING THIN-FILM TRANSISTOR
摘要 <p>PROBLEM TO BE SOLVED: To solve the problem, in which polycrystalline silicon or single-crystal silicon having large crystal grains being unable to be obtained, because the silicon grains are restrained from growing, in a method of crystallizing an amorphous silicon material through irradiation of its front face with a laser beam. SOLUTION: An insulating film 17 is formed on an amorphous silicon 13, and irregularities are provided on the surface of the insulating film 17. When the insulating film 17 is irradiated with a laser beam, the laser beam is apt to be concentrated in a certain region due to refraction phenomenon of light, and an amorphous silicon region of high temperature is produced. Another region, where the laser beam is not concentrated, becomes a region of low temperature. Crystallization starts from the region of low temperature, and the high and low temperature distribution is provided to amorphous silicon, so that polycrystalline silicon or single-crystal silicon of large grain diameter is formed.</p>
申请公布号 JP2002231629(A) 申请公布日期 2002.08.16
申请号 JP20010025212 申请日期 2001.02.01
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 KITAMURA KAZUKI;NISHIO MIKIO;KAWAKITA TETSUO
分类号 G02F1/1368;H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/20;G02F1/136 主分类号 G02F1/1368
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