| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection in manufacture of a product regarding an attachment of an IC having a memory for reading and writing data. SOLUTION: This product with IC inspection method is a method for inspecting the product manufactured through a process of attaching the IC having the memory for reading and writing data. It is characterized by that data to be written are written in the memory of the IC attached to the product, data are read from the memory of the IC attached to the product after writing, and the data to be written and the read data are collated to determine whether or not they match. |
