SEMICONDUCTOR MEMORY, AND METHOD OF CONFIRMING DEFECTIVE ADDRESS PROGRAMMED IN THIS DEVICE

摘要

PROBLEM TO BE SOLVED: To externally confirm the use or non-use of a defective address program circuit and a redundant fuse program circuit. SOLUTION: This device is constituted of defective address program circuits 32, 34 for programming a redundant control signal and a defective address responding to an address applied from a first control signal and the outside, a redundant-enable signal generating circuit for generating a comparison coincidence signal when an address inputted responding to a redundant control signal coincides with a defective address, output circuits 60, 62 for outputting the comparison coincidence signal and a redundant control signal to the outside responding to a second control signal at the time of a test, and a mode control signal setting circuit 36 for setting the states of the first control signal and the second control signal responding to a command signal externally applied and a mode setting signal.