发明名称 |
ESD PROTECTION CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide an ESD protection circuit capable of suppressing an unnecessary current. SOLUTION: A P-channel MOS transistor PT1 is connected between a power line L1 and a power line L2. A P-channel MOS transistor PT2 is connected between the power line L1 and a gate of the P-channel MOS transistor PT1 and a voltage of the power line L2 is applied to the gate. A P-channel MOS transistor PT3 is connected between the gate of the P-channel MOS transistor PT1 and the power line L2 and a voltage of the power line L1 is applied to the gate. Substrates of P-channel MOS transistors PT1-PT3 are connected to the gate of the P-channel MOS transistor PT1. In this ESD protection circuit, all current path between the power line L1 and the power line L2 are shut off in any cases.
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申请公布号 |
JP2002231886(A) |
申请公布日期 |
2002.08.16 |
申请号 |
JP20010023443 |
申请日期 |
2001.01.31 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
ARAI KATSUYA;KAGAMI TOSHIHIRO |
分类号 |
H01L27/04;H01L21/822;(IPC1-7):H01L27/04 |
主分类号 |
H01L27/04 |
代理机构 |
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