发明名称 ESD PROTECTION CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an ESD protection circuit capable of suppressing an unnecessary current. SOLUTION: A P-channel MOS transistor PT1 is connected between a power line L1 and a power line L2. A P-channel MOS transistor PT2 is connected between the power line L1 and a gate of the P-channel MOS transistor PT1 and a voltage of the power line L2 is applied to the gate. A P-channel MOS transistor PT3 is connected between the gate of the P-channel MOS transistor PT1 and the power line L2 and a voltage of the power line L1 is applied to the gate. Substrates of P-channel MOS transistors PT1-PT3 are connected to the gate of the P-channel MOS transistor PT1. In this ESD protection circuit, all current path between the power line L1 and the power line L2 are shut off in any cases.
申请公布号 JP2002231886(A) 申请公布日期 2002.08.16
申请号 JP20010023443 申请日期 2001.01.31
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 ARAI KATSUYA;KAGAMI TOSHIHIRO
分类号 H01L27/04;H01L21/822;(IPC1-7):H01L27/04 主分类号 H01L27/04
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