发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To improve the drive performance of a high breakdown voltage MOS transistor. SOLUTION: The semiconductor device comprises a low-concentration P- source and drain layer 11A formed in an N-well 5, a high-concentration P-source and drain layer formed in the low-concentration P-source and drain layer 11A, and an N-body layer 19A which constitutes a channel disposed between the source and drain layers. In the semiconductor device, a P-layer 32 is formed in a surface layer of the body layer 19A.
申请公布号 JP2002231937(A) 申请公布日期 2002.08.16
申请号 JP20010021204 申请日期 2001.01.30
申请人 SANYO ELECTRIC CO LTD 发明人 TANIGUCHI TOSHIMITSU;ARAI TAKASHI;YOSHITAKE KAZUHIRO
分类号 H01L29/78;H01L21/8238;H01L27/092;(IPC1-7):H01L29/78;H01L21/823 主分类号 H01L29/78
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