发明名称 Method for roughening a surface of a semioconductor substrate
摘要 <p>The present invention relates to a method for roughening a surface of a semiconductor substrate (1) comprising the steps of arranging the semiconductor substrate (1) in a furnace, providing a gas mixture comprising an inert gas and a halogen or a halogen-hydrogen compound in the furnace and providing a temperature between 700 and 1200 DEG C in the furnace. The inventive method is capable of roughening the surface of a semiconductor substrate resulting in an increased capacitor area with an increased capacity. &lt;IMAGE&gt;</p>
申请公布号 EP1231628(A1) 申请公布日期 2002.08.14
申请号 EP20010103005 申请日期 2001.02.08
申请人 INFINEON TECHNOLOGIES SC300 GMBH & CO. KG 发明人 STORBECK, OLAF;KURTENBACH, ANDREAS;KUERNER, WOLFGANG
分类号 H01L21/02;H01L21/3213;(IPC1-7):H01L21/02;H01L21/824 主分类号 H01L21/02
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