发明名称 |
Method for roughening a surface of a semioconductor substrate |
摘要 |
<p>The present invention relates to a method for roughening a surface of a semiconductor substrate (1) comprising the steps of arranging the semiconductor substrate (1) in a furnace, providing a gas mixture comprising an inert gas and a halogen or a halogen-hydrogen compound in the furnace and providing a temperature between 700 and 1200 DEG C in the furnace. The inventive method is capable of roughening the surface of a semiconductor substrate resulting in an increased capacitor area with an increased capacity. <IMAGE></p> |
申请公布号 |
EP1231628(A1) |
申请公布日期 |
2002.08.14 |
申请号 |
EP20010103005 |
申请日期 |
2001.02.08 |
申请人 |
INFINEON TECHNOLOGIES SC300 GMBH & CO. KG |
发明人 |
STORBECK, OLAF;KURTENBACH, ANDREAS;KUERNER, WOLFGANG |
分类号 |
H01L21/02;H01L21/3213;(IPC1-7):H01L21/02;H01L21/824 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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