发明名称 ELECTRIC FIELD PROBE
摘要 PROBLEM TO BE SOLVED: To make a near electromagnetic field from a relatively small wave source which has been difficult to be measured conventionally measurable with a simple constitution. SOLUTION: An inducted electromotive force generated in a loop consisting of a roughly parallel long path and a short path constituted by connecting the both ends of the long path is measured. Since the near electromagnetic field as the measurement objective suddenly attenuates along the long path and the long paths are close to each other, here, an approximation that path integration of whole loop is nearly equal to the path integration of the short path can be applied. Thus, by measuring the induction electromagnetic force generated in the loop, the induction electromagnetic force of the whole loop is obtained as a value corresponding to the near electromagnetic field component at one of the short path. And, an electric field probe capable of measuring a near electromagnetic field from relatively small wave source with a simple constitution can be provided.
申请公布号 JP2002228698(A) 申请公布日期 2002.08.14
申请号 JP20010026738 申请日期 2001.02.02
申请人 MELCO INC 发明人 TSUJI KATSUHIRO
分类号 G01R1/06;G01R29/08;H01Q1/38;H01Q7/00;H01Q7/04;(IPC1-7):G01R29/08 主分类号 G01R1/06
代理机构 代理人
主权项
地址