SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To inspect a flip-flop circuit to be operated by the positive phase clock and the negative phase clock by using one scan chain. SOLUTION: This semiconductor circuit is provided with a flip-flop circuit 422 for connecting a scan chain connected to flip-flop circuits 401 and 403 to be operated by the positive phase clock to a scan chain connected to flip-flop circuits 402 and 404 to be operated by the negative phase clock. A dummy data for being set to the flip-flop circuit 422 is included in a test pattern.