发明名称 HALFTONE PHASE SHIFT MASK BLANK AND HALFTONE PHASE SHIFT MASK USING THE SAME
摘要 <p>PROBLEM TO BE SOLVED: To provide a blank for a halftone phase shift mask which improves the transfer accuracy of a mask pattern and makes the inspection easy and to provide a halftone phase shift mask. SOLUTION: The blank for a halftone phase shift mask is produced by successively forming a light-shielding film 2 and a transparent film 1 on a transparent substrate 3. The refractive index of the light-shielding film at the exposure wavelength is higher than the refractive index of the transparent film.</p>
申请公布号 JP2002229177(A) 申请公布日期 2002.08.14
申请号 JP20010021193 申请日期 2001.01.30
申请人 TOPPAN PRINTING CO LTD 发明人 YAMAZAKI TSUKASA;MATSUO TADASHI;FUKUHARA NOBUHIKO;HARAGUCHI TAKASHI;KANAYAMA KOICHIRO
分类号 G03F1/32;G03F1/54;G03F1/68;G03F7/20;H01L21/027;(IPC1-7):G03F1/08 主分类号 G03F1/32
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