发明名称 |
HALFTONE PHASE SHIFT MASK BLANK AND HALFTONE PHASE SHIFT MASK USING THE SAME |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a blank for a halftone phase shift mask which improves the transfer accuracy of a mask pattern and makes the inspection easy and to provide a halftone phase shift mask. SOLUTION: The blank for a halftone phase shift mask is produced by successively forming a light-shielding film 2 and a transparent film 1 on a transparent substrate 3. The refractive index of the light-shielding film at the exposure wavelength is higher than the refractive index of the transparent film.</p> |
申请公布号 |
JP2002229177(A) |
申请公布日期 |
2002.08.14 |
申请号 |
JP20010021193 |
申请日期 |
2001.01.30 |
申请人 |
TOPPAN PRINTING CO LTD |
发明人 |
YAMAZAKI TSUKASA;MATSUO TADASHI;FUKUHARA NOBUHIKO;HARAGUCHI TAKASHI;KANAYAMA KOICHIRO |
分类号 |
G03F1/32;G03F1/54;G03F1/68;G03F7/20;H01L21/027;(IPC1-7):G03F1/08 |
主分类号 |
G03F1/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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