| 摘要 |
PROBLEM TO BE SOLVED: To perform an inspection with one test pattern in the case where flip-flop circuits to be operated with a positive phase clock and a negative phase clock exist together. SOLUTION: This semiconductor integrated circuit is provided with a selector circuit 421 for selecting any one of a clock signal and a reverse clock signal obtained by reversing the clock signal to supply it to a flip-flop circuit. When the selector circuit 421 selects the clock signal, a logic circuit 412 connected to a former stage of the flip-flop circuits 401, 403 to be operated by the positive phase clock is inspected. When the selector circuit 421 selects the reverse clock signal, a logic circuit 411 connected to a former stage of the flip-flop circuits 402 and 404 to be operated by the negative phase clock is inspected.
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