发明名称 DEVICE FOR MEASURING ION CONCENTRATION
摘要 PROBLEM TO BE SOLVED: To provide a device for measuring ion concentration which can surely adhere even to a minute and dented part, e.g. a tooth pit or the like and can surely measure the ion concentration of the part. SOLUTION: The ion concentration-measuring device is constituted of a sensor part 3 having an ISFET 8 formed to a leading end of a supporting member, and a display part 4 for processing signals from the sensor part 3 and displaying measured results. The ISFET 8 is provided with an ion response part 5 set to a spherical or curved semiconductor surface 7a.
申请公布号 JP2002228628(A) 申请公布日期 2002.08.14
申请号 JP20010023341 申请日期 2001.01.31
申请人 HORIBA LTD 发明人 IHI HIROYUKI;NAKANISHI TAKESHI
分类号 G01N27/414;A61B5/00 主分类号 G01N27/414
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