| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device for performing a terminal inspection mode setting by sequential data capable of performing a boundary scan test without a difficulty regardless of the form of a pattern of the boundary scan test. SOLUTION: The semiconductor device has a mask means 157 for masking a first output-control signal, which is generated by an output-control means 150 using at least a part of output signals of boundary scan means 112, 122 and 132 based upon inputs from terminals 111, 121 and 131, by a second output- control signal. An output signal of a predetermined boundary scan means is output-controlled by an output means 140 based upon the output of the mask means 157, thereby masking the terminal inspection mode during implementation of the boundary scan to secure an input-output function of the terminals 111, 121 and 131.
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