发明名称 Process for copper-plating a wafer using an anode having an iridium oxide coating
摘要 A process for copper-plating a wafer which comprises electroplating a semiconductor wafer with an electrode comprising a corrosion-resistant metal substrate and a coat mainly composed of iridium oxide provided on the substrate as an anode and the wafer as a cathode in a solution containing copper ion. The anode is preferably an insoluble electrode comprising a corrosion-resistant metal substrate and a coat mainly composed of iridium oxide and further containing a metal or metal oxide selected from platinum, tantalum, titanium, niobium and oxides of these metals provided on the substrate. A neutral membrane or ion exchange membrane may be interposed between the anode and the cathode as a separating membrane.
申请公布号 US6432293(B1) 申请公布日期 2002.08.13
申请号 US20000517588 申请日期 2000.03.03
申请人 PERMELEC ELECTRODE LTD. 发明人 OGATA SETSURO;UENO KENICHI
分类号 C25D3/38;C25D7/12;C25D17/10;(IPC1-7):C25D7/12;C25D11/32 主分类号 C25D3/38
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