发明名称 Semiconductor integrated circuit device and process for manufacture the same
摘要 The new structure of a memory cell which enables avoiding the problem of a step without increasing the number of processes, the structure of a semiconductor integrated circuit in which a common part of the same substrate in a manufacturing process is increased and the structure of the semiconductor integrated circuit which allows measures for environment obstacles without increasing the number of processes are disclosed. Memory cell structure in which a capacitor is formed in the uppermost layer of plural metal wiring layers by connecting the storage node of the capacitor to a diffusion layer via plugs and pads is adopted. It is desirable that a dielectric film formed in a metal wiring layer under the uppermost layer and a supplementary capacitor composed of a storage node and a plate electrode are connected to the capacitor. It is also desirable that the plate electrode of the capacitor covers the chip.
申请公布号 US6432769(B1) 申请公布日期 2002.08.13
申请号 US20000642582 申请日期 2000.08.22
申请人 HITACHI, LTD. 发明人 FUKUDA TAKUYA;KOBAYASHI NOBUYOSHI;NAKAMURA YOSHITAKA;SAITO MASAYOSHI;FUKADA SHINICHI;KAWAMOTO YOSHIFUMI
分类号 H01L21/3205;H01L21/768;H01L21/8242;H01L27/108;(IPC1-7):H01L29/72 主分类号 H01L21/3205
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